Abstract
There were obtained simple thin films of polypyrrole (PPy) and polythiophene (PTh) and double layer films polypyrrole / polythiophene (PPy/PTh) on silicon substrate from deposition in DC plasma reactor. The films obtained were characterized by FT-IR spectroscopy. The influence of thermal treatment on the structure of the films and of interactions at the interface PPy/PTh in 100-400 ºC domain temperatures in argon atmosphere was studied. It was observed that the PPy film processed in plasma is more stable in environmental air that PTh film. It was found that thermal treatment in the range 250-300 ºC in argon atmosphere release interaction between PPy/PTh films. The principal phenomenon observed in the double layer was one of protection of the more reactive PTh film counter oxidation process by coating with PPy layer. Keywords: plasma polymerization, thin films, interfaces phenomena