Abstract
Theoretical and experimental bases for estimating the thickness of the thin anisotropic layers in order to obtain and analyze the total polarized light are discussed, having in view the numerous applications in fundamental and applicative researches. The formulas expressing the thickness of the type wave, half-wave, quarter-wave layers as functions of the birefringence of the anisotropic medium are established. The obtained results could be used for obtaining anisotropic layers, introducing a desired phase difference between ordinary and extraordinary radiations, made up of inorganic crystals or from liquid crystals with a high degree of order at the room temperature. Keywords: wave-; half-wave and quarter-wave plates; birefringence; inorganic crystals; liquid crystals