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Materiale Plastice
Cite as: Mater. Plast.
https://doi.org/10.37358/Mat.Plast.1964

OSIM Nr. R102356
ISSN Print 0025-5289
ISSN Online 2668-8220
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Materiale Plastice (Mater. Plast.), Year 2006, Volume 43, Issue 2,





Thickness Computation of the Anisotropic Layers Used in the Analysis of the Light Polarization State


Abstract:
Theoretical and experimental bases for estimating the thickness of the thin anisotropic layers in order to obtain and analyze the total polarized light are discussed, having in view the numerous applications in fundamental and applicative researches. The formulas expressing the thickness of the type wave, half-wave, quarter-wave layers as functions of the birefringence of the anisotropic medium are established. The obtained results could be used for obtaining anisotropic layers, introducing a desired phase difference between ordinary and extraordinary radiations, made up of inorganic crystals or from liquid crystals with a high degree of order at the room temperature. Keywords: wave-; half-wave and quarter-wave plates; birefringence; inorganic crystals; liquid crystals



Issue: 2006 Volume 43, Issue 2
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